Physics - Education

Course description Scanning Probe Microscopy

Scanning Probe Microscopy (DESCRIPTION 2008-2009, information will be updated in July 2011)

Curriculum

Master of Science in Physics

Instructor(s)

ECTS

6

Level

500

Academic year

2008-2009

Language of instruction

English

Target group

Master students, PhD students

Synopsis

During the last 15 years, scanning-probe techniques have revolutionized the world of microscopy. Next to the familiar scanning tunneling microscope (STM) and the atomic force microscope (AFM), a growing collection of derived forms of microscopy exists, such as magnetic force microscopy (MFM) and scanning near-field optical microscopy (SNOM). This course treats the principles and applications of these new techniques. Important technical aspects of these microscopes (electronics, vibration isolation, actuators, and nano-motors, -) will be discussed in detail. We will also study applications in the fields of microscopy, spectroscopy, tribology (nano-friction), and atomic manipulation (nano-technology).
The course is given in the form of a mixture of lectures and workshop. A high level of initiative is expected from the participants themselves. Each participant should give at least one short presentation about one of the topics of the course. In addition, each participant should also discuss one scientific paper from the recent -scanning probe- literature. One or a few of the lectures will be organized in the form of an excursion to a scanning probe laboratory.

Prerequisites

Elementary Solid State Physics.

Programme form

Lectures, tutorial.
For each lecture, each participant is expected to read the material about the topic of that lecture (typically one chapter). For each lecture, one of the participants has to prepare a brief presentation of this material and another will prepare a presentation of a recent scientific paper, relevant to the topic of the lecture.

Required literature

Handouts.

Form of examination

The final grade will represent the presentations held during the course.

Period

Spring 2012, every two years.

Time table

http://www.physics.leidenuniv.nl/edu/master/schedule/RMSc_N.PDF

Notes

For more information

Instructor 2011-2012: Prof.dr. J.W.M. Frenken

See also website: http://www.physics.leidenuniv.nl/sections/cm/ip/Onderwijs/Scanning-Probe-Microscopy/


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Scanning Probe Microscopy (DESCRIPTION 2008-2009, information will be updated in July 2011)
Curriculum	Master of Science in Physics
Instructor(s)
ECTS	6
Level	500
Academic year	2008-2009
Language of instruction	English
Target group	Master students, PhD students
Synopsis	During the last 15 years, scanning-probe techniques have revolutionized the world of microscopy. Next to the familiar scanning tunneling microscope (STM) and the atomic force microscope (AFM), a growing collection of derived forms of microscopy exists, such as magnetic force microscopy (MFM) and scanning near-field optical microscopy (SNOM). This course treats the principles and applications of these new techniques. Important technical aspects of these microscopes (electronics, vibration isolation, actuators, and nano-motors, -) will be discussed in detail. We will also study applications in the fields of microscopy, spectroscopy, tribology (nano-friction), and atomic manipulation (nano-technology). The course is given in the form of a mixture of lectures and workshop. A high level of initiative is expected from the participants themselves. Each participant should give at least one short presentation about one of the topics of the course. In addition, each participant should also discuss one scientific paper from the recent -scanning probe- literature. One or a few of the lectures will be organized in the form of an excursion to a scanning probe laboratory.
Prerequisites	Elementary Solid State Physics.
Programme form	Lectures, tutorial. For each lecture, each participant is expected to read the material about the topic of that lecture (typically one chapter). For each lecture, one of the participants has to prepare a brief presentation of this material and another will prepare a presentation of a recent scientific paper, relevant to the topic of the lecture.
Required literature	Handouts.
Form of examination	The final grade will represent the presentations held during the course.
Period	Spring 2012, every two years.
Time table	http://www.physics.leidenuniv.nl/edu/master/schedule/RMSc_N.PDF
Notes
For more information	Instructor 2011-2012: Prof.dr. J.W.M. Frenken See also website: http://www.physics.leidenuniv.nl/sections/cm/ip/Onderwijs/Scanning-Probe-Microscopy/